• DocumentCode
    1210818
  • Title

    Enhanced double-histogram test

  • Author

    Jalon, M.A. ; Rueda, Andrea ; Peralias, E.

  • Author_Institution
    Inst. de Microelectron. de Sevilla, Univ. of Seville, Seville
  • Volume
    45
  • Issue
    7
  • fYear
    2009
  • Firstpage
    349
  • Lastpage
    351
  • Abstract
    A method is introduced for reducing experimental setup complexity and time costs associated with the A/D converters linearity test using double histograms. The method is independent of the waveform of the test signal and it does not require inclusion of any time-interleaved technique to reduce time-drift effects.
  • Keywords
    AC-DC power convertors; circuit testing; nonlinear functions; A/D converters linearity test; enhanced double-histogram test; time-drift effects;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2009.0203
  • Filename
    4807011
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1210818