• DocumentCode
    1211116
  • Title

    Nuclear-Radiation-Resistant Circuitry Design and Test

  • Author

    Perkins, James R.

  • Author_Institution
    Vought Electronics Dallas, Texas
  • Volume
    9
  • Issue
    1
  • fYear
    1962
  • Firstpage
    310
  • Lastpage
    315
  • Abstract
    Recent technological advances in the utilization of nuclear energy as a weapon and nuclear reactors as propulsion systems and in other applications have resulted in imposing severe radiation environments on automatic control systems. The work described in this paper concerns the design and testing of electronic circuits which comprise these systems. By special design the nuclear radiation damage thresholds of these circuits were raised from 1014 to 1017 fast neutrons/cm2. The nuclear environment in which the circuits were tested was generated by a 3-megawatt ground test reactor, the integrated dose over a 100-hour period being approximately 5×1016 fast neutrons/cm2. Twenty of the twenty-four circuits tested were operating properly at the termination of the test.
  • Keywords
    Circuit testing; Electronic equipment testing; Glass; Ionization; Lattices; Neutrons; Nuclear electronics; Radiation hardening; Resistors; System testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2015
  • Type

    jour

  • DOI
    10.1109/TNS2.1962.4315923
  • Filename
    4315923