DocumentCode
1211116
Title
Nuclear-Radiation-Resistant Circuitry Design and Test
Author
Perkins, James R.
Author_Institution
Vought Electronics Dallas, Texas
Volume
9
Issue
1
fYear
1962
Firstpage
310
Lastpage
315
Abstract
Recent technological advances in the utilization of nuclear energy as a weapon and nuclear reactors as propulsion systems and in other applications have resulted in imposing severe radiation environments on automatic control systems. The work described in this paper concerns the design and testing of electronic circuits which comprise these systems. By special design the nuclear radiation damage thresholds of these circuits were raised from 1014 to 1017 fast neutrons/cm2. The nuclear environment in which the circuits were tested was generated by a 3-megawatt ground test reactor, the integrated dose over a 100-hour period being approximately 5Ã1016 fast neutrons/cm2. Twenty of the twenty-four circuits tested were operating properly at the termination of the test.
Keywords
Circuit testing; Electronic equipment testing; Glass; Ionization; Lattices; Neutrons; Nuclear electronics; Radiation hardening; Resistors; System testing;
fLanguage
English
Journal_Title
Nuclear Science, IRE Transactions on
Publisher
ieee
ISSN
0096-2015
Type
jour
DOI
10.1109/TNS2.1962.4315923
Filename
4315923
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