• DocumentCode
    1211163
  • Title

    Self-Timed Regenerators for High-Speed and Low-Power On-Chip Global Interconnect

  • Author

    Singh, Prashant ; Seo, Jae-sun ; Blaauw, David ; Sylvester, Dennis

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI
  • Volume
    16
  • Issue
    6
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    673
  • Lastpage
    677
  • Abstract
    In this paper, we propose a new circuit technique called self-timed regenerator (STR) to improve both speed and power for on-chip global interconnects. The proposed circuits are placed along global wires to compensate the loss in resistive wires and to amplify the effect of wire inductance in the wires to enable transmission line like behavior. For different wire widths, the number of STR and sizing of the transistors are optimized to accelerate the signal propagation while consuming minimum power. In 90-nm CMOS technology, STR design achieved a delay improvement of 14% over the conventional repeater design. Furthermore, 20% power reduction is achieved for iso-delay, and 8% delay improvement for iso-power compared with the repeater design. The proposed technique has also been applied to a clock distribution network, reducing clock power by 26%.
  • Keywords
    CMOS integrated circuits; delays; integrated circuit design; integrated circuit interconnections; low-power electronics; nanoelectronics; CMOS technology; STR design; circuit technique; clock distribution network; clock power reduction; conventional repeater design; high-speed on-chip global interconnect; iso-delays; low-power on-chip global interconnects; power reduction; resistive wire loss compensation; self-timed regenerators; size 90 nm; transistor sizing; transmission line like behavior; wire inductance; CMOS technology; Clocks; Delay; Distributed parameter circuits; Inductance; Integrated circuit interconnections; Power transmission lines; Propagation losses; Repeaters; Wires; Circuit; interconnect; repeaters; signaling;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2008.2000250
  • Filename
    4511670