• DocumentCode
    1211462
  • Title

    Response of NAI (Tl) to X-Rays and Low Energy Gamm Rays

  • Author

    Kaiser, W.C. ; Baker, S.I. ; MacKay, A.J. ; Sherman, I.S.

  • Author_Institution
    Electonics Division Argonne National Laboratory Argonne, Illinois
  • Volume
    9
  • Issue
    3
  • fYear
    1962
  • fDate
    6/1/1962 12:00:00 AM
  • Firstpage
    22
  • Lastpage
    27
  • Abstract
    A thorough investigation of the response of NaI(Tl) in the region below 50 kev was made using a continuous distribution of X-rays from a tungsten target as well as monoenergetic gamma rays from radioactive sources. The results of this investigation agree well with those of Engelkemeir.1 The investigation also showed that below 20 kev NaI(Tl) is sensitive to surface treatment. Above 20 kev the response is independent of surface treatment as long as the surface is free of moisture. An electron response curve is shown which, when used with the decay scheme of the excited iodine atom, predicts the observed nonlinear response NaI(Tl) to low energy X-and)¿-rays.
  • Keywords
    Electrons; Energy measurement; Gamma rays; Laboratories; Moisture; Rough surfaces; Surface roughness; Surface treatment; Tungsten; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0096-2015
  • Type

    jour

  • DOI
    10.1109/TNS2.1962.4315967
  • Filename
    4315967