Title :
The signal transmission characteristics of embedded microstrip transmission lines over a meshed ground plane in copper/polyimide multichip module
Author :
Chien, Chung-Ping ; Burnett, A.F. ; Cech, Jay M. ; Tanielian, Minas H.
Author_Institution :
Interconnect Technol., Boeing Defense & Space Group, Seattle, WA, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
The high-speed digital signal transmission characteristics of a microstrip transmission line in a meshed ground plane environment were studied. It is found that ground plane geometry significantly affects the degree of crosstalk noise between two adjacent signal lines and the characteristic impedance of a transmission line. A signal conductor over a meshed ground plane exhibits less degradation in rise time and voltage amplitude, compared to a line over a solid ground plane, due to the lower line capacitance and lower conductor loss. However, the longer current path in the case of a meshed ground plane increases the overall line inductance which results in a slower propagation velocity. A ground plane with optimum geometric configuration, in mesh pitch and aperture, is chosen that meets system level performance requirements while still being compatible with processing constraints. The impact of transmission lines with meshed ground plane on multichip module design for digital applications is also discussed
Keywords :
capacitance; copper; crosstalk; delays; digital circuits; electric impedance; inductance; losses; microstrip lines; multichip modules; polymer films; Cu; Cu/polyimide multichip module; MCM design; adjacent signal lines; characteristic impedance; conductor loss; crosstalk noise; digital applications; embedded microstrip transmission lines; ground plane geometry; high-speed digital signal transmission; line capacitance; line inductance; mesh aperture; mesh pitch; meshed ground plane; multichip module; optimum geometric configuration; propagation velocity; rise time; signal transmission characteristics; system level performance requirements; voltage amplitude; Capacitance; Conductors; Crosstalk; Degradation; Geometry; Impedance; Inductance; Microstrip; Transmission lines; Voltage;
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on