Title :
Pattern classification by the Bayes machine
Author :
Diamantini, C. ; Spalvieri, A.
Author_Institution :
Dipartimento di Elettronica, Ancona Univ., Italy
fDate :
11/23/1995 12:00:00 AM
Abstract :
In pattern classification one has to test which class an observation vector belongs to, paying the minimum error probability. According to the nonparametric formulation, the statistical information is given by a labelled training set. The authors show how to design a classification rule by optimising the position of code vectors of a labelled vector quantiser under the minimum error probability criterion
Keywords :
Bayes methods; pattern classification; probability; Bayes machine; classification rule; code vectors; labelled training set; labelled vector quantiser; minimum error probability; observation vector; pattern classification;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19951412