DocumentCode :
1211917
Title :
A 14-bit high-temperature ΣΔ modulator in standard CMOS
Author :
Davis, Cailin ; Finvers, Ivars
Author_Institution :
SiWorks Inc., Calgary, Alta., Canada
Volume :
38
Issue :
6
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
976
Lastpage :
986
Abstract :
Experimental verification is given for the use of ΣΔ modulation for high-temperature applications (≥approximately 150°C) in a standard CMOS process. Switched-capacitor circuits are used to implement a second-order single-stage and a third-order 2-1 MASH ΣΔ modulator with single-bit quantization. The two modulators have an oversampling ratio of 256 with an input signal bandwidth of 500 Hz. The modulators were fabricated in a 1.5-μm standard CMOS technology. A fully differential signal path and near minimum sized switches are used to mitigate the effect of large junction-to-substrate leakage current present at high temperatures. Experimental results show both modulators are capable of over 14 bits of resolution at 225°C and over 13 bits of resolution at 255°C. Results show that the single-stage modulator is more resistant to high-temperature circuit impairment than is the MASH cascaded structure.
Keywords :
CMOS integrated circuits; high-temperature electronics; leakage currents; mixed analogue-digital integrated circuits; modulators; quantisation (signal); sigma-delta modulation; switched capacitor networks; 1.5 micron; 14 bit; 150 to 255 C; 500 Hz; ADC; MASH cascaded structure; SC circuits; analog-digital conversion; fully differential signal path; high-temperature ΣΔ modulator; high-temperature circuit impairment; junction-to-substrate leakage current; near minimum sized switches; oversampling ratio; second-order single-stage modulator; sigma-delta modulator; single-bit quantization; standard CMOS process; third-order MASH modulator; Bandwidth; CMOS process; CMOS technology; Leakage current; Multi-stage noise shaping; Quantization; Signal resolution; Switched capacitor circuits; Switches; Temperature;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2003.811973
Filename :
1202000
Link To Document :
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