DocumentCode :
1212047
Title :
Mach–Zehnder Interferometer for Real-Time In Situ Monitoring of Refractive Microlens Characteristics at the Fabrication Level
Author :
Gomez, Virginia ; Ottevaere, Heidi ; Thienpont, Hugo
Author_Institution :
Vrije Univ. Brussel, Brussels
Volume :
20
Issue :
9
fYear :
2008
fDate :
5/1/2008 12:00:00 AM
Firstpage :
748
Lastpage :
750
Abstract :
We present a Mach-Zehnder interferometer to monitor in situ and in real-time the geometrical and optical characteristics of refractive microlenses during their fabrication process to increase the fabrication accuracy as well as the sample-to-sample reproducibility. We demonstrate for one test case that the deviation of our developed interferometric system against commercial instrumentation is smaller than 5 % while its repeatability error is smaller than 1.5% after calibration against dedicated off-line instrumentation. To conclude, we demonstrate the practical usefulness of this interferometer by applying it to the fabrication of microlenses by deep proton writing.
Keywords :
Mach-Zehnder interferometers; microlenses; Mach-Zehnder interferometer; deep proton writing; fabrication level; real-time in situ monitoring; refractive microlens characteristic; Geometrical optics; Instruments; Lenses; Microoptics; Monitoring; Optical device fabrication; Optical interferometry; Optical refraction; Reproducibility of results; System testing; Characterization; deep proton writing (DPW); interferometry; microlenses; real-time in situ monitoring;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2008.921089
Filename :
4512099
Link To Document :
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