DocumentCode :
1212230
Title :
Two ions in one trap: ultra-high precision mass spectrometry?
Author :
Rainville, Simon ; Thompson, James K. ; Pritchard, David E.
Author_Institution :
Dept. of Phys., Massachusetts Inst. of Technol., Cambridge, MA, USA
Volume :
52
Issue :
2
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
292
Lastpage :
296
Abstract :
By trapping two different ions in the same Penning trap at the same time, we simultaneously measured the ratio of their cyclotron frequencies (from which we obtain their atomic mass ratio) with a precision of about 10-11 in only a few hours. In order to perform these comparisons, we must be able to measure and control all three normal modes of motion of each ion - cyclotron, axial, and magnetron. We have developed novel techniques to do, so and we are currently using these tools to carefully investigate the important question of systematic errors in those measurements. This new technique shows promise to expand the precision of mass spectrometry an order of magnitude beyond the current state-of-the-art.
Keywords :
mass spectroscopy; particle traps; trapped ions; Penning trap; atomic mass ratio; cyclotron frequencies; ion trapping; ultra-high precision mass spectrometry; Atomic measurements; Current measurement; Cyclotrons; Energy measurement; Frequency measurement; Magnetic field measurement; Mass spectroscopy; Metrology; Performance evaluation; Physics;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.810725
Filename :
1202032
Link To Document :
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