DocumentCode :
1212389
Title :
Extension of Swerlein´s algorithm for AC voltage measurement in the frequency domain
Author :
Kyriazis, Gregory A.
Author_Institution :
Inst. Nacional de Metrologia, Normalizacao e Qualidade Ind., Duque De Caxias, Brazil
Volume :
52
Issue :
2
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
367
Lastpage :
370
Abstract :
Two sampling algorithms that use a high-resolution voltmeter for accurately measuring the amplitudes and phase angles of the harmonics of a low-frequency, low-distortion, voltage waveform are presented. The technique is an extension to the frequency domain of a previously described approach. In the new approach, the harmonic parameters are evaluated by a least-squares, three-parameter, sine-fit algorithm. A faster algorithm that uses discrete Fourier transforms is also presented. The latter algorithm can estimate the parameters of m harmonics of a 100-Hz low distortion waveform in less than 4m seconds. The relative standard uncertainty associated with the RMS estimate depends on the waveform stability, harmonic content, and noise variance, and is 2.5×10-6 for low-distortion, 100 Hz sinusoidal waveforms in the 10-V range. This uncertainty figure includes the noise variance contribution of the waveform generator used in the tests.
Keywords :
discrete Fourier transforms; harmonic analysis; least squares approximations; measurement uncertainty; noise; signal sampling; stability; transfer standards; voltage measurement; 10 V; 100 Hz; RMS estimate; Swerlein algorithm; discrete Fourier transforms; frequency domain AC voltage measurement; frequency domain extension; harmonic amplitudes; harmonic parameters; harmonic phase angles; high-resolution voltmeter; least-squares three-parameter sine-fit algorithm; low distortion waveform; low-frequency low-distortion voltage waveform; noise variance; noise variance contribution; relative standard uncertainty; sampling algorithms; sinusoidal waveforms; waveform generator; waveform harmonic content; waveform stability; Discrete Fourier transforms; Frequency domain analysis; Harmonic distortion; Parameter estimation; Phase measurement; Sampling methods; Stability; Uncertainty; Voltage measurement; Voltmeters;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.811582
Filename :
1202049
Link To Document :
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