Title :
A First/Third-Order Probe Correction Technique for Spherical Near-Field Antenna Measurements Using Three Probe Orientations
Author :
Laitinen, Tommi ; Breinbjerg, Olav
fDate :
5/1/2008 12:00:00 AM
Abstract :
A probe correction technique is described for spherical near-field antenna measurements based on sampling the near field for three probe orientations in each measurement direction. The technique applies to odd-order probes whose radiated field contains (significant) power only in the first (mu = plusmn1) and third- order (mu = plusmn3) azimuthal spherical modes. The technique is ideally suited as an optional probe correction technique for high-accuracy measurements in existing measurement systems that employ a rectangular or square waveguide probe and the traditional first-order probe correction technique.
Keywords :
antenna radiation patterns; antenna testing; first/third-order probe correction technique; odd-order probe; rectangular/square waveguide probe; spherical near-field antenna measurement; Antenna measurements; Costs; Directive antennas; Error correction; Laboratories; Manufacturing; Power system modeling; Probes; Rectangular waveguides; Sampling methods; Antenna; first-order probe; probe correction; spherical near field;
Journal_Title :
Antennas and Propagation, IEEE Transactions on
DOI :
10.1109/TAP.2008.922615