DocumentCode :
1212466
Title :
A First/Third-Order Probe Correction Technique for Spherical Near-Field Antenna Measurements Using Three Probe Orientations
Author :
Laitinen, Tommi ; Breinbjerg, Olav
Volume :
56
Issue :
5
fYear :
2008
fDate :
5/1/2008 12:00:00 AM
Firstpage :
1259
Lastpage :
1268
Abstract :
A probe correction technique is described for spherical near-field antenna measurements based on sampling the near field for three probe orientations in each measurement direction. The technique applies to odd-order probes whose radiated field contains (significant) power only in the first (mu = plusmn1) and third- order (mu = plusmn3) azimuthal spherical modes. The technique is ideally suited as an optional probe correction technique for high-accuracy measurements in existing measurement systems that employ a rectangular or square waveguide probe and the traditional first-order probe correction technique.
Keywords :
antenna radiation patterns; antenna testing; first/third-order probe correction technique; odd-order probe; rectangular/square waveguide probe; spherical near-field antenna measurement; Antenna measurements; Costs; Directive antennas; Error correction; Laboratories; Manufacturing; Power system modeling; Probes; Rectangular waveguides; Sampling methods; Antenna; first-order probe; probe correction; spherical near field;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2008.922615
Filename :
4512147
Link To Document :
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