Title :
DC conductivity measurements in the Van der Pauw geometry
Author :
Rietveld, Gert ; Koijmans, Ch.V. ; Henderson, Lesley C A ; Hall, M.J. ; Harmon, S. ; Warnecke, Peter ; Schumacher, Bernd
Author_Institution :
Dept. of Electricity & Magnetism, NMi Van Swinden Lab., Delft, Netherlands
fDate :
4/1/2003 12:00:00 AM
Abstract :
A new methodology for conductivity measurements, where square metallic samples are measured with the Van der Pauw technique, has been successfully implemented. The uncertainty obtained is 0.04% and a comparison between national metrology institutes gives an agreement of the measurement values within 0.035%. Major advantages of the new method are that smaller reference samples are required and only a single dimensional measurement is needed.
Keywords :
electrical conductivity measurement; measurement standards; measurement uncertainty; DC conductivity measurements; Van der Pauw geometry; conductivity measurements; measurement values; national metrology institutes; reference samples; single dimensional measurement; uncertainty; Aerospace materials; Conducting materials; Conductivity measurement; Current measurement; Density estimation robust algorithm; Eddy currents; Geometry; Measurement standards; Metrology; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.809917
