CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards

Author

Jarrett, Dean G. ; Dziuba, Ronald F.

Author_Institution

U.S. Dept. of Commerce, Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA

Volume

52

Issue

2

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

474

Lastpage

477

Abstract

An international comparison of DC resistance at 10 MΩ and 1 GΩ was organized under the auspices of the Consultative Committee for Electricity and Magnetism (CCEM) and piloted by the National Institute of Standards and Technology (NIST) with 14 other National Metrology Institutes (NMIs) participating. The transport standards were measured by the participating NMIs during a three-and-a-half year period beginning August 1996 and concluding March 2000. The transport standards used for this comparison were a set of three wirewound 10-MΩ standard resistors and three film-type 1-GΩ standard resistors, all packaged at NIST for this key comparison. The comparison demonstrated that all participating NMIs agree with the key comparison reference value at 10 MΩ and 1 GΩ within the 95% confidence level.

Keywords

calibration; electric resistance measurement; measurement standards; resistors; transfer standards; 1 Gohm; 10 Mohm; CCEM-K2 key comparison; DC resistance; NIST; film-type standard resistors; international comparison; national metrology institutes; resistance standards; transport standards; wirewound standard resistors; Electric resistance; Electrical resistance measurement; Laboratories; Measurement standards; Metrology; NIST; Particle measurements; Resistors; Time measurement; Transport protocols;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2003.811654

Filename

1202077