Title :
Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays
Author :
Behr, Ralf ; Funck, Torsten ; Schumacher, Bernd ; Warnecke, Peter
Author_Institution :
Phys. Tech. Bundesanstalt, Braunschweig, Germany
fDate :
4/1/2003 12:00:00 AM
Abstract :
To determine arbitrary resistance ratios with high precision, a measuring system based on a dual Josephson voltage standard has been set up. It is demonstrated that, by means of this system, 10-kΩ standard resistors can be linked to a quantized Hall resistance (i=2, 12.9 kΩ) with an expanded uncertainty (k=2) of less than 4 parts in 109.
Keywords :
Josephson effect; electric resistance measurement; measurement standards; measurement uncertainty; potentiometers; quantum Hall effect; resistors; superconducting arrays; voltage measurement; 10 kohm; SINIS Josephson array; dual Josephson potentiometer; measurement uncertainty; quantized Hall resistance; resistance ratio; resistance standard; standard resistor; voltage standard; Cryogenics; Current measurement; Electrical resistance measurement; Josephson junctions; Measurement standards; Microwave antenna arrays; Potentiometers; Resistors; Switches; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2003.811569
