• DocumentCode
    1212797
  • Title

    Mitigation of Critical Current Degradation in Mechanically Loaded {\\hbox {Nb}}_{3}{\\hbox {Sn}} Superconducting Multi-Strand Cable

  • Author

    Seo, K. ; Nishimura, A. ; Hishinuma, Y. ; Nakamura, K. ; Takao, T. ; Nishijima, G. ; Watanabe, K. ; Katagiri, K.

  • Author_Institution
    Nat. Inst. for Fusion Sci., Gifu
  • Volume
    18
  • Issue
    2
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    491
  • Lastpage
    494
  • Abstract
    It was reported that Lorentz force caused degradation of critical current in the ITER-TFMC conductor. We have used our novel experimental setup, which utilizes the closed electric circuit concept for critical current and stability measurements of multi-stand superconducting cables. The feature of this setup is mechanical loading applied to the multi-strand cable in the transverse direction. Significant degradation in the critical current of the cable was observed when the average compressive stress was about 20 MPa. This degradation was found irreversible after unloading. We tested the cable with epoxy or ice molds as well. No degradation was observed in the molded cables. We also tested the cable with smaller void fraction. In this case, significant degradation in critical current was observed.
  • Keywords
    critical currents; fusion reactor materials; mechanical testing; moulding; niobium alloys; stability; superconducting cables; superconducting coils; tin alloys; type II superconductors; ITER-TFMC conductor; Lorentz force; Nb3Sn; closed electric circuit; compressive stress; critical current degradation; epoxy mold; ice mold; stability measurement; superconducting multistrand cable; transverse mechanical loading; void fraction; $hbox{Nb}_{3}hbox{Sn}$ ; CICC; critical current; ice; superconducting multi-strand cables; transverse load;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2008.920791
  • Filename
    4512182