DocumentCode :
121287
Title :
Direct imaging of nanophotonic cavity modes using Li ion microscope
Author :
Jie Zou ; Twedt, Kevin A. ; Davanco, Marcelo ; Srinivasan, K. ; McClelland, Jabez ; Aksyuk, Vladimir A.
Author_Institution :
Univ. of Maryland, College Park, MD, USA
fYear :
2014
fDate :
17-21 Aug. 2014
Firstpage :
47
Lastpage :
48
Abstract :
Micrometer-scale photonic cavities with high quality factors (Q) enable on chip motion sensing with unparalleled precision and bandwidth. The optical mode shape is critical for the transducer performance, yet it is difficult to measure directly and noninvasively. Here we use a scanning lithium ion microscope to visualize the electric field energy density of a 10 um diameter, 245 nm thick, 60000 Q Si microdisk optical cavity and to identify the radial order of the mode. The technique utilizes a beam of Li ions as a high spatial resolution noncontact probe, minimally perturbing the measured cavity resonance.
Keywords :
elemental semiconductors; ion microscopes; lithium; micro-optics; nanophotonics; optical resonators; silicon; Li; Si; cavity resonance; direct imaging; electric field energy density; high quality factors; microdisk optical cavity; micrometer-scale photonic cavities; nanophotonic cavity modes; on chip motion sensing; optical mode shape; scanning lithium ion microscope; size 10 mum; size 245 nm; Cavity resonators; Optical fibers; Optical imaging; Optical resonators; Optical sensors; Optical surface waves; Particle beam optics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2014 International Conference on
Conference_Location :
Glasgow
ISSN :
2160-5033
Print_ISBN :
978-0-9928-4140-9
Type :
conf
DOI :
10.1109/OMN.2014.6924536
Filename :
6924536
Link To Document :
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