• DocumentCode
    121287
  • Title

    Direct imaging of nanophotonic cavity modes using Li ion microscope

  • Author

    Jie Zou ; Twedt, Kevin A. ; Davanco, Marcelo ; Srinivasan, K. ; McClelland, Jabez ; Aksyuk, Vladimir A.

  • Author_Institution
    Univ. of Maryland, College Park, MD, USA
  • fYear
    2014
  • fDate
    17-21 Aug. 2014
  • Firstpage
    47
  • Lastpage
    48
  • Abstract
    Micrometer-scale photonic cavities with high quality factors (Q) enable on chip motion sensing with unparalleled precision and bandwidth. The optical mode shape is critical for the transducer performance, yet it is difficult to measure directly and noninvasively. Here we use a scanning lithium ion microscope to visualize the electric field energy density of a 10 um diameter, 245 nm thick, 60000 Q Si microdisk optical cavity and to identify the radial order of the mode. The technique utilizes a beam of Li ions as a high spatial resolution noncontact probe, minimally perturbing the measured cavity resonance.
  • Keywords
    elemental semiconductors; ion microscopes; lithium; micro-optics; nanophotonics; optical resonators; silicon; Li; Si; cavity resonance; direct imaging; electric field energy density; high quality factors; microdisk optical cavity; micrometer-scale photonic cavities; nanophotonic cavity modes; on chip motion sensing; optical mode shape; scanning lithium ion microscope; size 10 mum; size 245 nm; Cavity resonators; Optical fibers; Optical imaging; Optical resonators; Optical sensors; Optical surface waves; Particle beam optics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical MEMS and Nanophotonics (OMN), 2014 International Conference on
  • Conference_Location
    Glasgow
  • ISSN
    2160-5033
  • Print_ISBN
    978-0-9928-4140-9
  • Type

    conf

  • DOI
    10.1109/OMN.2014.6924536
  • Filename
    6924536