DocumentCode :
1212937
Title :
Thin silicon ion-implanted p-i-n photodiodes
Author :
Plumb, R.G. ; Carroll, J.E.
Author_Institution :
University of Cambridge, Engineering Department, Cambridge, UK
Volume :
1
Issue :
3
fYear :
1977
fDate :
4/1/1977 12:00:00 AM
Firstpage :
89
Lastpage :
91
Abstract :
Thin (6¿¿m) thick Si has been ion implanted to fabricate a p¿¿i¿¿n photodiode with an overall rise time probably better than 80 ps. The narrow depletion region gives short transit times, and the shallow ion-implanted junctions lead to minimal amounts of minority carrier storage, thus eliminating any slow tail to the voltage-output response to a step change of light input.
Keywords :
photodetectors; photodiodes; Si photodiodes; ion implanted junctions; minority carrier storage; narrow depletion region; overall rise time; short transit times;
fLanguage :
English
Journal_Title :
Solid-State and Electron Devices, IEE Journal on
Publisher :
iet
ISSN :
0308-6968
Type :
jour
DOI :
10.1049/ij-ssed.1977.0010
Filename :
4807522
Link To Document :
بازگشت