DocumentCode :
1212985
Title :
Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standard
Author :
Zimmerman, Neil M. ; Sabbagh, Mahmoud A EL ; Wang, Yicheng
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
52
Issue :
2
fYear :
2003
fDate :
4/1/2003 12:00:00 AM
Firstpage :
608
Lastpage :
611
Abstract :
We report on several advances in the development of a cryogenic vacuum-gap capacitor Ccryo, for use with the electron-counting capacitance standard (ECCS). First, we have increased the value by about a factor of ten, to 10 pF; this will both make the ECCS more useful as a commercial standard and also allows a substantial reduction in the relative uncertainty of the calibration of Ccryo. Second, the capacitor´s stability is excellent, with a relative drift less than 10-9/hour. This stability is required for the third advance: we have succeeded in tuning the calculable capacitor, which allows us to make a measurement of SI units, without requiring us to fabricate the capacitor to have a precise value of Ccryo. We demonstrate such a measurement, with an uncertainty of about 4×10-8.
Keywords :
capacitance measurement; capacitors; cryogenic electronics; measurement standards; measurement uncertainty; 10 pF; ECCS; SI measurement; calculable capacitor tuning; capacitor stability; capacitor value; cryogenic vacuum-gap capacitor; electron-counting capacitance standard; measurement uncertainty; relative calibration uncertainty; relative drift; Bridge circuits; Calibration; Capacitance measurement; Capacitors; Cryogenics; Electrical resistance measurement; Measurement standards; NIST; Stability; Standards development;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.2003.810026
Filename :
1202107
Link To Document :
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