• DocumentCode
    1213061
  • Title

    Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon

  • Author

    Bettin, Horst ; Toth, Hans

  • Author_Institution
    Phys. Tech. Bundesanstalt, Braunschweig, Germany
  • Volume
    52
  • Issue
    2
  • fYear
    2003
  • fDate
    4/1/2003 12:00:00 AM
  • Firstpage
    636
  • Lastpage
    640
  • Abstract
    To reveal the reason for the discrepancy of relatively 3·10-6 in the molar volume of silicon found in crystals of different origin, the densities of crystals grown under different conditions were compared using a flotation method. The method and the apparatus used at Physikalisch-Technische Bundesanstalt, Braunschweig, Germany, and the evaluation of data using Lagrange multipliers are described. The obtained results are reported and the contributions to the standard uncertainty of the silicon density ρsi of about 1.0·10-7ρsi are discussed.
  • Keywords
    density measurement; measurement uncertainty; silicon; Lagrange multiplier; Si; density; flotation measurement; measurement uncertainty; molar volume; silicon single crystal; Atomic measurements; Calibration; Crystals; Density measurement; Lagrangian functions; Silicon; Temperature; Thermal expansion; Uncertainty; Volume measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2003.810721
  • Filename
    1202113