DocumentCode :
1213161
Title :
Using Linear Relations Between Experimental Characteristics in Stiff Identification Problems of Linear Circuit Theory
Author :
Adalev, Alexei S. ; Korovkin, Nikolay V. ; Hayakawa, Masashi
Author_Institution :
Dept. of Electron. Eng., Univ. of Electro-Commun., Tokyo
Volume :
55
Issue :
5
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1237
Lastpage :
1247
Abstract :
The paper treats an inverse problem posed in the time domain for a circuit described by a stiff system of ordinary differential equations (ODEs). Identification of model parameters (circuit elements) is performed by processing transient characteristics measured in the circuit. An illustrative example discussed throughout the paper shows that reducing the identification problem to curve fitting, which is the most general way, may be hardly used for a stiff model due to a ravine shape of the objective functional. Moreover, a necessity of solving the stiff ODE system to get a functional value makes the inverse problem be practically unsolvable. It has been shown that the initial inverse problem may be simplified significantly by taking into account linear relations which are observed between the experimental characteristics measured for a stiff system. The relation coefficients are discussed in the paper with regard to the accuracy of the approximation. Finally the initial identification problem has been reduced to a nonlinear system of algebraic equations which may be easily solved considering different sensitivity of the relation coefficients to the model parameters. The final solution is presented for different levels of "measurement" error involved in the simulation.
Keywords :
algebra; analogue circuits; curve fitting; differential equations; fault diagnosis; inverse problems; matrix algebra; algebraic equations; analog circuit fault diagnosis; curve fitting; experimental characteristics; ill-conditioned matrix; inverse problem; linear circuit theory; nonlinear system; ordinary differential equations; stiff identification problems; time domain; transient characteristics; Analog circuit fault diagnosis; analog circuit identification; ill-conditioned matrix; stiff problem;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2008.924908
Filename :
4512358
Link To Document :
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