DocumentCode :
1213268
Title :
Optical Investigation of Surface Flashover Plasma Across Silicon Stimulated by Pulsed High Voltage in Vacuum Based on ICCD
Author :
Zhao, Wen-Bin ; Zhang, Guan-Jun ; Dong, Ming ; Yan, Zhang
Author_Institution :
Sch. of Electr. Eng., Xi´´an Jiaotong Univ., Xi´´an
Volume :
36
Issue :
4
fYear :
2008
Firstpage :
880
Lastpage :
881
Abstract :
Optical investigation of flashover phenomena across silicon is performed in vacuum. A pulse waveform of ~0.4/2.5 mus is employed as stimulation source. The p100-type silicon wafers are the samples. The images of flashover growing are recorded by intensified charge couple device, and the corresponding waveforms of voltage and current are given. The results primarily suggest that the flashover across p-type silicon begins with the distortion of electric field at the edge of anode. Injection of minors may play an important role in the formation process of filament current. It is regarded that the plasma produced by ionized desorbed gas will appear at the final stage of surface flashover.
Keywords :
elemental semiconductors; flashover; plasma diagnostics; silicon; surface discharges; ICCD; Si; current waveform; electric field distortion; filament current; intensified charge couple device; ionized desorbed gas; optical investigation; p100-type silicon wafers; pulsed high-voltage stimulation; surface flashover plasma; voltage waveform; HV pulse; semiconductor; surface flashover;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2008.922483
Filename :
4512500
Link To Document :
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