DocumentCode :
1213397
Title :
Microstructure Analyses of Metal-Filled Carbon Nanotubes Synthesized by Microwave Plasma-Enhanced Chemical Vapor Deposition
Author :
Hayashi, Yasuhiko ; Tokunaga, Tomoharu ; Kaneko, Kenji ; Henley, Simon J. ; Stolojan, Vlad ; Carey, J. David ; Silva, S.R.P.
Author_Institution :
Dept. of Environ. Technol. & Urban Planning, Nagoya Inst. of Technol.
Volume :
5
Issue :
5
fYear :
2006
Firstpage :
485
Lastpage :
490
Abstract :
Pd/Co-based metal-filled carbon nanotubes (MF-CNTs) were synthesized by a microwave plasma-enhanced chemical vapor deposition method using a bias-enhanced growth technique. Pd/Co-based MF-CNTs were analyzed by scanning electron microscopy (SEM), transmission electron microscopy (TEM) electron energy loss spectroscopy (EELS), and Raman spectroscopy. MF-CNTs were well-aligned and uniform in size on a Si substrate. Both multiwall nanotube carbon nanotubes (CNTs) and herringbone (or stacked cups structure) structures were observed. High-resolution TEM revealed that MF-CNTs were composed of highly ordered graphite layers, and the elemental maps of EELS indicate that both Co and Pd metals are present inside the nanotubes. TEM results clearly showed that both Pd and Co metals were successfully encapsulated into the CNTs. We observed a low value for the Raman intensity ratio between D (1355 cm-1) and G (1590 cm-1) bands with no shift of the G-peak position and no broadening of the G-peak, indicative of high-quality Pd/Co-based MF-CNTs. Based on TEM characterization, we propose a description for the encapsulating mechanisms
Keywords :
Raman spectra; carbon nanotubes; cobalt; electron energy loss spectra; palladium; plasma CVD; scanning electron microscopy; transmission electron microscopy; EELS; MF-CNTs; Pd-Co-C; Raman spectroscopy; SEM; Si; TEM; bias-enhanced growth; electron energy loss spectroscopy; encapsulation mechanisms; graphite layers; herringbone structures; high-resolution transmission electron microscopy; metal-filled carbon nanotubes; microstructure analysis; microwave plasma-enhanced chemical vapor deposition method; scanning electron microscopy; Carbon nanotubes; Chemical analysis; Chemical vapor deposition; Microstructure; Microwave theory and techniques; Plasma chemistry; Raman scattering; Scanning electron microscopy; Spectroscopy; Transmission electron microscopy; Electron energy loss spectroscopy (EELS); metal filled carbon nanotubes (CNTs); microwave plasma-enhanced chemical vapor deposition (MP-CVD); scanning electron microscopy (SEM); transmission electron microscopy (TEM);
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2006.880456
Filename :
1695946
Link To Document :
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