Title :
Exploring Fine-Grained Fault Tolerance for Nanotechnology Devices With the Recursive NanoBox Processor Grid
Author :
KleinOsowski, A.J. ; Pai, Vasudev V. ; Rangarajan, Vijay ; Ranganath, Priyadarshini ; KleinOsowski, Kevin ; Subramony, Mahesh ; Lilja, David J.
Author_Institution :
Minnesota Univ.
Abstract :
Advanced molecular nanotechnology devices are predicted to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS devices. We describe and evaluate the Recursive NanoBox Processor Grid as an application specific, fault-tolerant, parallel computing system designed for fabrication with unreliable nanotechnology devices. In this study we construct hardware description language models of a NanoBox Processor cell and evaluate the effectiveness of our recursive fault masking approach in the presence of random errors. Our analysis shows that complex circuits constructed with encoded lookup tables can operate correctly despite 2% of the nodes being in error. The circuits operate partially correct with up to 4% of the nodes being in error
Keywords :
computer architecture; fault tolerance; grid computing; hardware description languages; logic design; molecular electronics; nanoelectronics; parallel processing; CMOS devices; encoded lookup tables; fine-grained fault tolerance; hardware description language models; inherent device defects; logic design; molecular nanotechnology devices; parallel computing system; random errors; recursive fault masking approach; recursive nanobox processor grid; transient fault rates; Circuit faults; Error correction; Fabrication; Fault tolerance; Fault tolerant systems; Hardware design languages; Nanoscale devices; Nanotechnology; Parallel processing; Semiconductor device modeling; Computer architecture; fault tolerance; logic design; nanotechnology; robustness;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2006.880901
