Title :
Development of nanoscale thermometry by fluorescence lifetime measurement in near-field using time correlated single photon counting
Author :
Seto, Daichi ; Taguchi, Yasuhiro ; Saiki, T. ; Nazasaka, Yuji
Author_Institution :
Sch. of Integrated Design Eng., Keio Univ., Yokohama, Japan
Abstract :
A novel noncontact and nanoscale temperature measurement method using fluorescence in near-field, namely Fluor-NOTN (Fluorescence Near-field Optics Thermal Nanoscopy) has been developed. Fluor-NOTN enables to detect the temperature dependence of fluorescence lifetime of CdSe quantum dots (Qdot) at nanoscale spatial resolution. In our case, however, the spatial resolution is limited by the sensitivity of the optical system. This paper reports the feasibility study of a proposed TCSPC (Time Correlated Single Photon Counting) to enhance the temperature measurement sensitivity of Fluor-NOTN. The experimental result indicated that Fluor-NOTN using TCSPC can measure the near-field fluorescence lifetime with 60 nm spatial resolution.
Keywords :
II-VI semiconductors; cadmium compounds; fluorescence; nanophotonics; photon counting; semiconductor quantum dots; temperature measurement; wide band gap semiconductors; CdSe; fluorescence lifetime measurement; fluorescence near-field optics thermal nanoscopy; nanoscale spatial resolution; nanoscale thermometry; quantum dots; temperature dependence; temperature measurement sensitivity; time correlated single photon counting; Apertures; Fluorescence; Laser excitation; Nanoscale devices; Probes; Spatial resolution; Temperature measurement;
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2014 International Conference on
Conference_Location :
Glasgow
Print_ISBN :
978-0-9928-4140-9
DOI :
10.1109/OMN.2014.6924601