Title :
DC and RF characteristics of E-mode Ga/sub 0.51/In/sub 0.49/P-In/sub 0.15/Ga/sub 0.85/As pseudomorphic HEMTs
Author :
Hsing-Yuan Tu ; Tao-Hsuan Chou ; Yo-Sheng Lin ; Hsien-Chin Chiu ; Ping-Yu Chen ; Wen-Chung Wu ; Shey-Shi Lu
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
3/1/2003 12:00:00 AM
Abstract :
The DC and RF characteristics of Ga/sub 0.49/In/sub 0.51/P-In/sub 0.15/Ga/sub 0.85/As enhancement- mode pseudomorphic HEMTs (pHEMTs) are reported for the first time. The transistor has a gate length of 0.8 μm and a gate width of 200 μm. It is found that the device can be operated with gate voltage up to 1.6 V, which corresponds to a high drain-source current (I/sub DS/) of 340 mA/mm when the drain-source voltage (V/sub DS/) is 4.0 V. The measured maximum transconductance, current gain cut-off frequency, and maximum oscillation frequency are 255.2 mS/mm, 20.6 GHz, and 40 GHz, respectively. When this device is operated at 1.9 GHz under class-AB bias condition, a 14.7-dBm (148.6 mW/mm) saturated power with a power-added efficiency of 50% is achieved when the drain voltage is 3.5 V. The measured Fmin is 0.74 dB under I/sub DS/=15 mA and V/sub DS/=2 V.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; high electron mobility transistors; indium compounds; microwave field effect transistors; 0.8 micron; 1.6 V; 1.9 GHz; 15 mA; 2 V; 20.6 GHz; 200 micron; 3.5 V; 4.0 V; 40 GHz; 50 percent; DC characteristics; Ga/sub 0.49/In/sub 0.51/P-In/sub 0.15/Ga/sub 0.85/As; Ga/sub 0.51/In/sub 0.49/P-In/sub 0.15/Ga/sub 0.85/As; RF characteristics; class-AB bias condition; cut-off frequency; drain voltage; drain-source current; drain-source voltage; enhancement-mode pseudomorphic HEMTs; gate length; gate voltage; gate width; maximum oscillation frequency; maximum transconductance; pHEMTs; power-added efficiency; saturated power; Current measurement; Cutoff frequency; Frequency measurement; Gain measurement; Gallium arsenide; Low-frequency noise; PHEMTs; Radio frequency; Transconductance; Voltage;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2003.809045