• DocumentCode
    1213542
  • Title

    Fixed-interface-charge model for isotype heterojunctions

  • Author

    Delagebeaudeuf, D. ; Lescroel, M.

  • Author_Institution
    Thomson-CSF, Laboratoire Central de Recherches, Paris, France
  • Volume
    2
  • Issue
    3
  • fYear
    1978
  • fDate
    5/1/1978 12:00:00 AM
  • Firstpage
    91
  • Lastpage
    93
  • Abstract
    Numerous anomalies have been observed in the electrical characteristics of isotype n-Ge/n-GaAs heterojunctions which cannot be explained by the existing models. These are (a) the `apparent¿¿ inverse barrier in I/V experiments is often anormally high (b) the dependence of the barrier on doping concentration is opposite to predicted behaviour (c) the I/V intercept voltage is always higher than the apparent inverse barrier resulting from I/V experiments (d) the slope dC/dV can be normally inversed or even flat. The proposed model assumes a given fixed negative interface charge to allow the existence of depletion layers in both semiconductors. The different anomalies are then explained by assuming an interface negative charge corresponding to the trapping of about two electrons by each interface impurity atom.
  • Keywords
    III-V semiconductors; elemental semiconductors; gallium arsenide; germanium; semiconductor device models; semiconductor junctions; depletion layers; doping concentration; fixed interface charge model; inverse barrier; isotype heterojunctions; n-Ge-n-GaAs; negative interface charge; semiconductors;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Journal on
  • Publisher
    iet
  • ISSN
    0308-6968
  • Type

    jour

  • DOI
    10.1049/ij-ssed.1978.0037
  • Filename
    4807586