DocumentCode
1213542
Title
Fixed-interface-charge model for isotype heterojunctions
Author
Delagebeaudeuf, D. ; Lescroel, M.
Author_Institution
Thomson-CSF, Laboratoire Central de Recherches, Paris, France
Volume
2
Issue
3
fYear
1978
fDate
5/1/1978 12:00:00 AM
Firstpage
91
Lastpage
93
Abstract
Numerous anomalies have been observed in the electrical characteristics of isotype n-Ge/n-GaAs heterojunctions which cannot be explained by the existing models. These are (a) the `apparent¿¿ inverse barrier in I/V experiments is often anormally high (b) the dependence of the barrier on doping concentration is opposite to predicted behaviour (c) the I/V intercept voltage is always higher than the apparent inverse barrier resulting from I/V experiments (d) the slope dC/dV can be normally inversed or even flat. The proposed model assumes a given fixed negative interface charge to allow the existence of depletion layers in both semiconductors. The different anomalies are then explained by assuming an interface negative charge corresponding to the trapping of about two electrons by each interface impurity atom.
Keywords
III-V semiconductors; elemental semiconductors; gallium arsenide; germanium; semiconductor device models; semiconductor junctions; depletion layers; doping concentration; fixed interface charge model; inverse barrier; isotype heterojunctions; n-Ge-n-GaAs; negative interface charge; semiconductors;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Journal on
Publisher
iet
ISSN
0308-6968
Type
jour
DOI
10.1049/ij-ssed.1978.0037
Filename
4807586
Link To Document