Title :
Analysis of the Frequency Response of Carbon Nanotube Transistors
Author :
Akinwande, Deji ; Close, Gael F. ; Wong, H. S Philip
Author_Institution :
Dept. of Electr. Eng., Stanford Univ.
Abstract :
The characterizations of carbon nanotube transistors at high frequencies have so far been hindered by large parasitic and extrinsic capacitances. We present a quantitative analysis of the limitations imposed by probe pad parasitics on single-wall carbon nanotube transistor characterization at gigahertz frequencies. Our analysis reveals the various kinds of frequency responses that can be expected to be measured. Furthermore, we present design guidelines and a suitable device layout to achieve gain and bandwidth at gigahertz frequencies
Keywords :
carbon nanotubes; field effect transistors; nanotube devices; C; bandwidth; extrinsic capacitances; frequency response; gigahertz frequencies; parasitic capacitances; probe pad parasitics; quantitative analysis; single-wall carbon nanotube transistors; Bandwidth; Capacitance measurement; Carbon nanotubes; Frequency measurement; Frequency response; Parasitic capacitance; Probes; Radio frequency; Size measurement; Transconductance; Carbon nanotube transistors; RF circuit analysis; RF transistors; frequency response;
Journal_Title :
Nanotechnology, IEEE Transactions on
DOI :
10.1109/TNANO.2006.880451