Title :
Infra-red microscopy direct observation of current redistribution and SPICE simulation of latch-up I/V hysteresis effects
Author :
Cavioni, T. ; Martino, Salvatore ; Muschitiello, Michele ; Stucchi, Michele ; Corsi, F. ; Zanoni, Enrico
Author_Institution :
SGS Thomson, Milan, Italy
Abstract :
The hysteresis cycle in the latch-up I/V characteristics of CMOS structures has been electrically observed and investigated by means of infra-red microscopy. This technique enables hysteresis effects to be correlated with current density distribution along different parasitic SCRs in a shunt connection. This correlation is confirmed by numerical simulation using SPICE.
Keywords :
CMOS integrated circuits; digital simulation; integrated circuit testing; optical microscopy; thyristors; CMOS structures; SPICE simulation; current density distribution; current redistribution; infra-red microscopy; latch-up I/V hysteresis effects; parasitic SCRs;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890916
