• DocumentCode
    1213870
  • Title

    Physics-based simulation techniques for small- and large-signal device noise analysis in RF applications

  • Author

    Bonani, Fabrizio ; Guerrieri, Simona Donati ; Ghione, Giovanni

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Torino, Italy
  • Volume
    50
  • Issue
    3
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    633
  • Lastpage
    644
  • Abstract
    The paper presents a review on physics-based noise simulation techniques for RF semiconductor devices, starting with the small-signal case but with greater stress on noise in large-signal (quasi)-periodic operation. The nonautonomous (forced) operation case will be considered, which is relevant to all RF applications apart from oscillators. Besides their importance in device design, physics-based noise models can also suggest viable and correct strategies to implement circuit-oriented models, e.g., compact models. From this standpoint, the connection between physics-based and circuit-oriented modeling is discussed both in the small-signal and in the large-signal case, with particular stress on the treatment of colored noise in the large-signal periodic regime.
  • Keywords
    UHF devices; equivalent circuits; semiconductor device models; semiconductor device noise; simulation; RF semiconductor devices; circuit-oriented models; colored noise; forced operation; large-signal device noise analysis; large-signal periodic regime; nonautonomous operation; physics-based noise models; physics-based noise simulation techniques; quasi-periodic operation; review; small-signal device noise analysis; Analytical models; Circuit noise; Circuit simulation; Colored noise; Data mining; FETs; Predictive models; Radio frequency; Semiconductor device noise; Stress;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2003.810477
  • Filename
    1202578