DocumentCode :
121392
Title :
Co-evaporated CuInSe2: Influence of growth temperature and Na on solar cell performance
Author :
Brunken, S. ; Greiner, D. ; Allaf Navirian, Hengameh ; Kaufmann, C.A. ; Unold, T.
Author_Institution :
Helmholtz-Zentrum Berlin fur Mater. und Energie, Berlin, Germany
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
3629
Lastpage :
3632
Abstract :
CuInSe2 films were prepared by a 3-stage-co-evaporation process. For Na-free absorbers we do not observe any influence of the preparation temperature between 330 °C and 510 °C on the solar cell performance with typical efficiencies around 9 %. NaF-PDT leads to an increase of the open-circuit voltage and the efficiency for samples prepared at a growth temperature of 450 °C and 510 °C (around 13 % for such samples). For samples prepared at 330 °C NaF-PDT has no influence on the open circuit voltage and the efficiency although the treatment increases the charge carrier concentration. At higher preparation temperatures, absorbers with Na present during growth (NaF-precursor samples) lead to similar IV parameters as NaF-PDT absorbers. NaF-precursor samples grown at temperatures at 330 °C, show an X-ray diffraction reflex, which is characteristic for the presence of twin stacking faults within the growing thin films. Solar cells with these absorbers show bad performances. In contrast, Na-free grown absorbers do not show twin stacking faults after the absorber growth process independently of the preparation temperature. Capacitance-voltage measurements give charge carrier concentrations of around 3×1016 cm-3 (NaF-precursor samples), 5×1015 cm-3 (NaF-PDT samples) and 6×1014 cm-3 (Na-free samples). From scanning electron microscopy it is deduced that Na, which is present during the growth, leads to films with smaller grain sizes.
Keywords :
X-ray diffraction; carrier density; copper compounds; indium compounds; scanning electron microscopy; semiconductor growth; semiconductor thin films; solar cells; vacuum deposition; 3-stage-co-evaporation process; CuInSe2; Na; NaF-PDT; X-ray diffraction reflex; absorber growth process; capacitance-voltage measurements; charge carrier concentration; grain sizes; growth temperature; open-circuit voltage; preparation temperatures; scanning electron microscopy; solar cell performance; temperature 330 degC to 510 degC; twin stacking faults; Charge carriers; Circuit faults; Films; Photovoltaic cells; Stacking; Temperature; Temperature measurement; CISe; chalcopyrite; charge carrier concentration; photovoltaic cells; sodium; twin stacking faults;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6924893
Filename :
6924893
Link To Document :
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