DocumentCode :
121402
Title :
Uncertainty analysis for maximum power at SRC using hierarchical Monte Carlo simulation
Author :
Campanelli, Mark ; Emery, Keith ; Elmore, Ryan ; Zaharatos, Brian
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
3670
Lastpage :
3675
Abstract :
We present an uncertainty analysis (UA) for the maximum power of photovoltaic devices at standard reporting conditions, denoted Pmax0. The UA employs a hierarchical Monte Carlo (MC) simulation to sample from the state-of-knowledge probability distribution for Pmax0, based upon an irradiance and spectrally corrected current-voltage curve measured (nominally) at 1-sun according to ASTM E948-09 or E1036-12. A conditional factoring of the joint distribution of the parameters that determine Pmax0 allows rigorous consideration of both systematic (e.g., calibration chain) and random (e.g., solar simulator noise) sources of uncertainty in Pmax0. The corresponding hierarchical MC simulation is computationally efficient and parallelizable, allowing enough samples to control MC sampling error. The UA method complies with the Guide to the Expression of Uncertainty in Measurement.
Keywords :
Monte Carlo methods; solar cells; standards; ASTM E948-09; E1036-12; Guide to the Expression of Uncertainty in Measurement; MC sampling error; SRC; calibration chain; conditional factoring; hierarchical MC simulation; hierarchical Monte Carlo simulation; irradiance; maximum power; photovoltaic devices; solar simulator noise; uncertainty analysis; Current measurement; Measurement uncertainty; Noise; Standards; Temperature measurement; Uncertainty; Voltage measurement; Monte Carlo simulation; calibration; hierarchical modeling; maximum power; measurement uncertainty; noise; uncertainty analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6924903
Filename :
6924903
Link To Document :
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