Title :
Thermal compact modeling of parallel plate heat sinks
Author :
Narasimhan, Sridhar ; Bar-Cohen, Avram ; Nair, Rajesh
Author_Institution :
Dept. of Mech. Eng., Univ. of Minnesota, Minneapolis, MN, USA
fDate :
3/1/2003 12:00:00 AM
Abstract :
Growing complexity of electronic systems has resulted in an increased computational effort in CFD modeling of electronic systems. To reduce the computational effort, one or several heat sinks can be represented by a compact "porous block" model, with an effective thermal conductivity and pressure loss coefficient. In this study of parallel plate heat sinks in laminar forced convection, a methodology is developed to rigorously determine the thermal properties of compact heat sink models that provide a high level of accuracy. The results of an extensive set of CFD simulations for a three heat sink channel covering two distinct heat sink geometries, air velocities from 0.25 m/s to 2 m/s and various spacings between the heat sinks, were used to create and evaluate the fidelity of compact models. The results of this study establish the validity and value in using the porous block compact model representation for noncritical heat sinks in an electronic assembly. The results also reveal that a location-independent porous-block representation can yield excellent agreement in the prediction of the thermal characteristics of state-of-the-art heat sinks.
Keywords :
computational fluid dynamics; cooling; forced convection; heat sinks; modelling; thermal analysis; thermal conductivity; thermal management (packaging); CFD modeling; CFD simulations; compact heat sink models; effective thermal conductivity; electronic systems; laminar forced convection; parallel plate heat sinks; porous block model; pressure loss coefficient; thermal compact modeling; thermal properties; three heat sink channel; Assembly; Computational fluid dynamics; Heat sinks; Packaging; Power system modeling; Resistance heating; Solid modeling; Thermal conductivity; Thermal force; Thermal resistance;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2003.811860