DocumentCode :
1214349
Title :
Impact of on-chip interconnect frequency-dependent R(f)L(f) on digital and RF design
Author :
Cao, Yu ; Huang, Xuejue ; Sylvester, Dennis ; King, Tsu-Jae ; Hu, Chenming
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
Volume :
13
Issue :
1
fYear :
2005
Firstpage :
158
Lastpage :
162
Abstract :
On-chip global interconnect exhibits clear frequency dependence in both resistance (R) and inductance ( L). In this paper, its impact on modern digital and radio frequency (RF) circuit design is examined. First, a physical and compact ladder circuit model is developed to capture this behavior, which only employs frequency independent R and L elements, and thus, supports transient analysis. Using this new model we demonstrate that the use of dc values for R and L is sufficient for timing analysis (i.e., 50% delay and slew rate) in digital designs. However, RL frequency dependence is critical for the analysis of signal integrity, shield line insertion, power supply stability, and RF inductor performance.
Keywords :
delay circuits; digital integrated circuits; electric resistance; inductors; integrated circuit interconnections; ladder networks; power system stability; radiofrequency integrated circuits; system-on-chip; timing circuits; transient analysis; RF circuit design; RF inductor; SOC; compact ladder circuit model; delay rate; digital circuit design; digital integrated circuits; electric resistance; inductance; integrated circuit interconnections; on-chip interconnect frequency dependence; physical circuit model; power supply stability; radio frequency circuit design; radiofrequency integrated circuits; shield line insertion; signal integrity; slew rate; system-on-chip; timing analysis; transient analysis; Circuit synthesis; Delay; Frequency dependence; Inductance; Integrated circuit interconnections; Radio frequency; Radiofrequency integrated circuits; Signal analysis; Timing; Transient analysis; Delay; frequency-dependence; inductance; noise; overshoot; quality factor; resistance; slew rate;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2004.840399
Filename :
1386273
Link To Document :
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