Title :
Sulfurization approach using sulfur vapor, graphite box and H2S gas atmospheres for co-sputtered Cu2ZnSnS4 thin film
Author :
Khalkar, Arun ; Kwang-Soo Lim ; Seong-Man Yu ; Jin Hyeok Kim ; Ji-Beom Yoo
Author_Institution :
SKKU Adv. Inst. of Nanotechnol. (St.), Sungkyunkwan Univ., Suwon, South Korea
Abstract :
In this work we have prepared Cu2ZnSnS4 (CZTS) precursor by magnetron co-sputtering using Cu, SnS and ZnS sputter targets. We employed three sulfurization approaches to prepare CZTS thin film and further compared their characterizations. In one approach, the precursor was sulfurized in a two zone tubular furnace directly exposed to the S vapor with N2 gas. In second approach, similar precursor was sulfurized in the same furnace but inside a graphite box together with 500mg of sulphur powder was evaporated in N2 gas inert atmosphere. Finally, in third approach precursor was sulfurized in the same furnace and was directly exposed to the H2S gas (balanced with 97 vol% of N2 gas) at flow rate of 50sccm. All sulphurization approaches were performed at temperature of 550°C for 60 min at atmospheric pressure. We have analyzed that the film sulfurized in H2S gas leads to compact grain structure, desired elemental composition, good optical and electrical characterization than when sulfurization was carried out in S vapor and S vapor in a graphite box under same thermodynamic conditions. The elemental composition of film was also analyzed by Secondary ion mass spectrometry (SIMS). The film was further analyzed by X-ray diffractometer (XRD), Raman scattering, X-ray photoelectron spectroscopy (XPS), Transmission electron microscopy (TEM) which showed Cu2ZnSnS4 is the kesterite phase. The optical and electrical properties clearly shows CZTS film with an optical band gap of 1.5 eV, absorption coefficient of 8.5×104 cm-1 and p-type semiconducting behavior with charge carrier concentration of 3.09×1017 cm-3.
Keywords :
Raman spectra; X-ray diffraction; X-ray photoelectron spectra; absorption coefficients; atmospheric pressure; copper compounds; hydrogen compounds; nitrogen; secondary ion mass spectra; semiconductor materials; sputtering; tin compounds; transmission electron microscopy; zinc compounds; Cu2ZnSnS4; H2S; N2; Raman scattering; SIMS; TEM; X-ray diffractometer; X-ray photoelectron spectroscopy; XPS; XRD; absorption coefficient; atmospheric pressure; charge carrier concentration; compact grain structure; electrical characterization; electron volt energy 1.5 eV; elemental composition; gas inert atmosphere; graphite box; magnetron cosputtering; optical band gap; optical characterization; p-type semiconducting behavior; quaternary semiconducting material; secondary ion mass spectrometry; sulfur vapor; sulfurization approach; temperature 550 degC; thermodynamic conditions; thin film; time 60 min; transmission electron microscopy; zone tubular furnace; Annealing; Furnaces; Optical films; Optical scattering; Tin; Zinc; Cu2ZnSnS4 thin film; Hall Effect; Raman scattering; magnetron co-sputtering; optical absorption coefficient; optical band gap; thin film; x-ray diffractometer;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6924940