DocumentCode :
1214399
Title :
Hygroscopic swelling and sorption characteristics of epoxy molding compounds used in electronic packaging
Author :
Ardebili, Haleh ; Wong, Ee Hua ; Pecht, Michael
Author_Institution :
CALCE Electron. Products & Syst. Center, Univ. of Maryland, College Park, MD, USA
Volume :
26
Issue :
1
fYear :
2003
fDate :
3/1/2003 12:00:00 AM
Firstpage :
206
Lastpage :
214
Abstract :
Moisture induced swelling and sorption characteristics of four types of epoxy molding compounds used in the packaging of semiconductor devices were experimentally investigated. The hygroscopic strain with respect to moisture content was found to be linear except at the initial stages of desorption where anomalous trends were observed. The swelling coefficient values obtained from the "stable" swelling regions were found to range from 0.3 to 0.6 (%L/%M) at 85°C for the four types of molding compounds tested. It was also found that the swelling coefficient increased with temperature for all four types of molding compounds tested. The significance impact of hygroscopic mismatch strain was investigated by comparing the strains induced due to mismatch of the coefficient of hygroscopic swelling and the coefficient of thermal expansion for each type of molding compound when attached to a copper lead frame. The hygroscopic and thermal mismatch strains were compared using the swelling coefficient and CTE values for each type of molding compound and adjacent material (i.e., copper lead frame). Hygroscopic mismatch strains were found to be highly significant relative to the thermal mismatch strains, and they should be accounted for in the reliability modeling of packages subjected to accelerated testing. The effect of hygroscopic mismatch strains is often ignored in the reliability tests and models. In this study it is found that the hygroscopic strains can be comparable to, if not higher than, thermal mismatch strains.
Keywords :
desorption; integrated circuit packaging; integrated circuit reliability; moisture; moulding; plastic packaging; polymers; semiconductor device packaging; semiconductor device reliability; swelling; thermal expansion; thermal stresses; 85 C; CTE; Cu; accelerated testing; coefficient of thermal expansion; copper lead frame; electronic packaging; epoxy molding compounds; hygroscopic mismatch strain; hygroscopic mismatch strains; hygroscopic strain; hygroscopic swelling; initial desorption stages; moisture content; moisture diffusion test; moisture induced swelling; plastic encapsulated microelectronics; reliability modeling; semiconductor device packaging; sorption characteristics; stable swelling regions; swelling coefficient; thermal mismatch strains; Capacitive sensors; Copper; Electronic packaging thermal management; Electronics packaging; Moisture; Semiconductor device packaging; Semiconductor devices; Temperature; Testing; Thermal expansion;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2002.806172
Filename :
1202922
Link To Document :
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