DocumentCode
1214414
Title
Pulsed characterisation and nonlinear modelling of four terminal LDMOS for smart power amplifiers
Author
Labrousse, N. ; Bouny, J.J. ; Campovecchio, M. ; Teyssier, J.P.
Author_Institution
Freescale Semicond., Toulouse
Volume
44
Issue
10
fYear
2008
Firstpage
636
Lastpage
637
Abstract
A novel transistor with four terminals (4T) directly based on the silicon LDMOS process is presented. Pulsed I-V and S characterisations are proposed to provide a straightforward method for determining the nonlinear model (NLM) of such a 4T LDMOS. On wafer measurements of devices are done on a specific three-port measurement setup. The agreement between NLM and measured performance is reported.
Keywords
MOSFET; power amplifiers; four terminal LDMOS; nonlinear modelling; pulsed characterisation; smart power amplifiers; three-port measurement setup;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:20080411
Filename
4515926
Link To Document