DocumentCode
121452
Title
Combinatorial study of co-sputtered Cu2 ZnSnS4 thin-film stoichiometry for photovoltaic devices
Author
Valentini, M. ; Malerba, C. ; Salza, E. ; de Luca, M. ; Capizzi, M. ; Mittiga, Alberto
Author_Institution
Casaccia Res. Center, ENEA, Rome, Italy
fYear
2014
fDate
8-13 June 2014
Abstract
In this work we investigate the role of stoichiometry variations in Cu2ZnSnS4 thin films obtained via sulfurization of precursor grown by co-sputtering of binary sulphides. Combinatorially graded thin-film Cu-Zn-Sn-S library samples spanning a large region of the ternary Cu2S-ZnS-SnS2 phase diagram were deposited at temperatures below 110°C and subsequently sulfurized at 550°C in a tube furnace using a stoichiometric excess of sulfur. We present some results on the influence of chemical composition, measured by EDX, on the morphological and mechanical properties of the films. The films were also processed to obtain a matrix of small area complete photovoltaic devices. In this way the correlation between the stoichiometry and the device performances can be clarified. Finally, several interesting devices were more completely characterized by measuring J-V characteristic curves, the External Quantum Efficiency (EQE) and by looking at their photoluminescence (PL) spectrum trying to confirm a recently suggested correlation between PL peak energies and photovoltaic performances.
Keywords
X-ray chemical analysis; copper compounds; internal stresses; phase diagrams; photoluminescence; semiconductor growth; semiconductor materials; semiconductor thin films; solar cells; sputter deposition; stoichiometry; surface morphology; zinc compounds; Cu2ZnSnS4; EDX; J-V characteristic curves; binary sulphides; chemical composition; cosputtered thin films; external quantum efficiency; mechanical properties; morphological properties; photoluminescence; photovoltaic devices; stoichiometric excess; sulfurization; temperature 550 degC; ternary phase diagram; Correlation; Films; Performance evaluation; Photovoltaic cells; Photovoltaic systems; Tin; CZTS; Sputtering; Thin Film Solar Cell; stoichiometry;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6924953
Filename
6924953
Link To Document