Title :
A novel technique to measure the propagation loss of integrated optical waveguides
Author :
Fazludeen, R. ; Barai, Samit ; Pattnaik, Prasant Kumar ; Srinivas, T. ; Selvarajan, A.
Author_Institution :
Electr. Commun. Eng. Dept., Indian Inst. of Sci., Bangalore, India
Abstract :
A novel method is presented to measure the propagation loss of integrated optical waveguides. The measurement system involves two 3-dB couplers, a charge coupled device camera, and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of low to high loss waveguides prepared by annealed proton exchange (APE) in lithium niobate (LiNbO3) and silver ion exchange in BK7 glass substrates are examined. The measurement system is found to be feasible over a broad range. This method offers a precision of 0.04 dB in case of a 25-mm-long waveguide prepared by APE.
Keywords :
CCD image sensors; annealing; integrated optics; ion exchange; optical couplers; optical information processing; optical loss measurement; optical testing; optical waveguides; 25 mm; 3-dB couplers; Ag; BK7 glass substrates; LiNbO3; SiO2; annealed proton exchange; charge coupled device camera; coupling conditions; high-loss waveguides; integrated optical waveguides; lithium niobate; low-loss waveguides; measurement system; propagation loss measurement; propagation properties; signal processing unit; silver ion exchange; Charge measurement; Charge-coupled image sensors; Couplers; Current measurement; Integrated optics; Loss measurement; Optical propagation; Optical signal processing; Optical waveguides; Propagation losses; Annealed proton exchanged (APE) waveguide; coupling conditions; integrated optics; propagation loss;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.839450
