Title :
Reactive ion etched black silicon texturing: A comparative study
Author :
Allen, T. ; Bullock, J. ; Cuevas, Andres ; Baker-Finch, Simeon ; Karouta, F.
Author_Institution :
Res. Sch. of Eng., Australian Nat. Univ., Canberra, ACT, Australia
Abstract :
We report on significant progress towards the application of reactive ion etched (RIE) black silicon (b-Si) as an alternative to the most commonly applied front-side textures utilized in the crystalline silicon photovoltaics industry - random pyramids and isotexture. The as-etched b-Si surface displays approximately 1% front side reflectance weighted across the solar spectrum, outperforming both random pyramids (2.83%) and isotexture (6.06%) with optimized anti-reflection coatings. The b-Si front surface reflectance reduces to below 0.4% after the application of an Al2O3 surface passivation layer. At low injection levels, recombination of charge carriers at the b-Si surface poses no limitation on the minority carrier lifetimes of bulk-limited Cz and multicrystalline samples. At higher injection, or with higher quality substrates, additional recombination at the b-Si surface, characterized by a surface Jos of 20 fA.cm-2, may play a more significant role. This study provides a rigorous empirical justification for recent advances in b-Si textured solar cells and indicates pathways for further efficiency gains.
Keywords :
antireflection coatings; elemental semiconductors; passivation; reflectivity; silicon; solar cells; Al2O3; Si; antireflection coatings; charge carriers; crystalline silicon photovoltaics industry; front side reflectance; front-side textures; isotexture; random pyramids; reactive ion etched black silicon texturing; solar spectrum; surface passivation layer; textured solar cells; Absorption; Aluminum oxide; Photovoltaic cells; Silicon; Surface morphology; Surface texture; Surface treatment; black silicon; isotexture; pyramids; surface passivation; texturing;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6924983