Title :
Assessment of waveguide thermal response by interrogation of UV written planar gratings
Author :
Sparrow, I.J.G. ; Emmerson, G.D. ; Gawith, C.B.E. ; Watts, S.P. ; Williams, R.B. ; Smith, Peter G. R.
Author_Institution :
Optoelectronics Res. Centre, Univ. of Southampton, UK
Abstract :
The technique of direct grating writing, based on direct ultraviolet writing, is demonstrated as a tool for highly accurate measurement of waveguide and material properties. Silica-on-silicon planar samples are processed using hydrogen loading and thermal locking before Bragg channel waveguides are defined in the photosensitive core layer. The refractive index is accurately probed to compare different thermal locking procedures and characterize waveguide thermal stability.
Keywords :
Bragg gratings; optical fabrication; optical planar waveguides; rapid thermal annealing; refractive index; thermal stability; thermo-optical effects; ultraviolet lithography; Bragg channel waveguides; UV written planar gratings interrogation; hydrogen loading; photosensitive core layer; refractive index; silica-on-silicon planar gratings; thermal locking; waveguide thermal stability; Bragg gratings; Etching; Optical planar waveguides; Optical waveguides; Planar waveguides; Rapid thermal processing; Refractive index; Thermal stability; Wavelength measurement; Writing; Gratings; integrated optics; photothermal effects; planar waveguides; rapid thermal processing;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.839457
