Evaluation of damage in DNA molecules resulting from very-low-frequency magnetic fields by using bacterial mutation repairing genetic system

Author

Igarashi, Akira ; Kobayashi, Koichiro ; Matsuki, Hidetoshi ; Endo, Ginro ; Haga, Akira

Author_Institution

Fac. of Eng., Iwate Univ., Morioka, Japan

Volume

41

Issue

11

fYear

2005

Firstpage

4368

Lastpage

4370

Abstract

The effect of very-low-frequency magnetic fields (VLFMF) on living biological cells was investigated using a highly sensitive mutagenesis assay method. A bacterial gene expression system for mutation repair (umu system) was used for the sensitive evaluation of damage in DNA molecules. Salmonella typhimurium TA1535/pSK1002 were exposed to VLFMF (20 kHz, 600 μT, and 60 kHz, 100 μT) in a specially designed magnetic field exposure chamber. The experimental results showed the possibility of applying the umu assay for sensitive and effective evaluation of damage in DNA molecules. No significant difference was observed in the umu gene expression intensity under exposure to magnetic field of 20 kHz, 600 μT, and 60 kHz, 100 μT.

Keywords

DNA; genetic engineering; magnetic field effects; radiation effects; 100 muT; 20 kHz; 60 kHz; 600 muT; DNA molecules; bacterial mutation repair; damage evaluation; genetic system; magnetic fields; mutagenesis assay; Biological cells; Coils; DNA; Frequency; Gene expression; Genetic engineering; Genetic mutations; Home appliances; Magnetic fields; Microorganisms; Mutation repairing gene; Salmonella typhimurium TA1535/pSK1002; umu assay; very-low-frequency magnetic field (VLFMF);

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2005.854837

Filename

1532356