DocumentCode :
1215281
Title :
Evaluation of damage in DNA molecules resulting from very-low-frequency magnetic fields by using bacterial mutation repairing genetic system
Author :
Igarashi, Akira ; Kobayashi, Koichiro ; Matsuki, Hidetoshi ; Endo, Ginro ; Haga, Akira
Author_Institution :
Fac. of Eng., Iwate Univ., Morioka, Japan
Volume :
41
Issue :
11
fYear :
2005
Firstpage :
4368
Lastpage :
4370
Abstract :
The effect of very-low-frequency magnetic fields (VLFMF) on living biological cells was investigated using a highly sensitive mutagenesis assay method. A bacterial gene expression system for mutation repair (umu system) was used for the sensitive evaluation of damage in DNA molecules. Salmonella typhimurium TA1535/pSK1002 were exposed to VLFMF (20 kHz, 600 μT, and 60 kHz, 100 μT) in a specially designed magnetic field exposure chamber. The experimental results showed the possibility of applying the umu assay for sensitive and effective evaluation of damage in DNA molecules. No significant difference was observed in the umu gene expression intensity under exposure to magnetic field of 20 kHz, 600 μT, and 60 kHz, 100 μT.
Keywords :
DNA; genetic engineering; magnetic field effects; radiation effects; 100 muT; 20 kHz; 60 kHz; 600 muT; DNA molecules; bacterial mutation repair; damage evaluation; genetic system; magnetic fields; mutagenesis assay; Biological cells; Coils; DNA; Frequency; Gene expression; Genetic engineering; Genetic mutations; Home appliances; Magnetic fields; Microorganisms; Mutation repairing gene; Salmonella typhimurium TA1535/pSK1002; umu assay; very-low-frequency magnetic field (VLFMF);
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.854837
Filename :
1532356
Link To Document :
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