• DocumentCode
    1215330
  • Title

    Nonequilibrium response of m.o.s. devices to a linear voltage ramp in the presence of illumination

  • Author

    Allman, P.G.C. ; Board, K.

  • Author_Institution
    University of Wales, Department of Electrical and Electronic Engineering, University College of Swansea, Swansea, UK
  • Volume
    3
  • Issue
    5
  • fYear
    1979
  • fDate
    9/1/1979 12:00:00 AM
  • Firstpage
    117
  • Lastpage
    120
  • Abstract
    The response of m.o.s. devices to a fast linear voltage ramp, when under illumination, is analysed. The presence of traps in the semiconductor bulk is taken into account, and it is found that bulk generation and photogeneration are similar, but not identical, effects. The devices exhibit a photoresponse up to a maximum value of light intensity, when saturation occurs, and no further light sensitivity is observed. Experimental data is presented for conditions when bulk generation is significant and insignificant, and good agreement is found in each case between theory and experiment.
  • Keywords
    metal-insulator-semiconductor devices; MOS device nonequilibrium response; bulk generation; illumination; light intensity; linear voltage ramp; photogeneration; photoresponse; semiconductor traps;
  • fLanguage
    English
  • Journal_Title
    Solid-State and Electron Devices, IEE Journal on
  • Publisher
    iet
  • ISSN
    0308-6968
  • Type

    jour

  • DOI
    10.1049/ij-ssed.1979.0025
  • Filename
    4807777