DocumentCode
1215330
Title
Nonequilibrium response of m.o.s. devices to a linear voltage ramp in the presence of illumination
Author
Allman, P.G.C. ; Board, K.
Author_Institution
University of Wales, Department of Electrical and Electronic Engineering, University College of Swansea, Swansea, UK
Volume
3
Issue
5
fYear
1979
fDate
9/1/1979 12:00:00 AM
Firstpage
117
Lastpage
120
Abstract
The response of m.o.s. devices to a fast linear voltage ramp, when under illumination, is analysed. The presence of traps in the semiconductor bulk is taken into account, and it is found that bulk generation and photogeneration are similar, but not identical, effects. The devices exhibit a photoresponse up to a maximum value of light intensity, when saturation occurs, and no further light sensitivity is observed. Experimental data is presented for conditions when bulk generation is significant and insignificant, and good agreement is found in each case between theory and experiment.
Keywords
metal-insulator-semiconductor devices; MOS device nonequilibrium response; bulk generation; illumination; light intensity; linear voltage ramp; photogeneration; photoresponse; semiconductor traps;
fLanguage
English
Journal_Title
Solid-State and Electron Devices, IEE Journal on
Publisher
iet
ISSN
0308-6968
Type
jour
DOI
10.1049/ij-ssed.1979.0025
Filename
4807777
Link To Document