• DocumentCode
    1215410
  • Title

    Realizable reduction of interconnect circuits including self and mutual inductances

  • Author

    Amin, Chirayu S. ; Chowdhury, Masud H. ; Ismail, Yehea I.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northwestern Univ., Evanston, IL, USA
  • Volume
    24
  • Issue
    2
  • fYear
    2005
  • Firstpage
    271
  • Lastpage
    277
  • Abstract
    Reduction of an extracted netlist is an important preprocessing step for techniques such as model order reduction (MOR) in the design and analysis of very large scale integration circuits (VLSICs). This work describes a method for realizable reduction of extracted resistance-capacitance-inductance-mutual inductance netlists by node elimination. The method is much faster than MOR techniques and, hence, is appropriate as a preprocessing step. The proposed method eliminates nodes with time constants below a user-specified time constant. By giving the freedom to the user to select a critical point in the spectrum of nodal time constants, this method provides an option to make a tradeoff between accuracy and reduction. The proposed method preserves the dc characteristics and the first two moments at all nodes. It also recognizes and eliminates all the redundant inductances generated by the extraction tools. The proposed method naturally reduces to TICER (Sheehan, 1999) in the absence of any inductances.
  • Keywords
    RLC circuits; VLSI; inductance; integrated circuit design; integrated circuit interconnections; network analysis; reduced order systems; circuit reduction; extracted netlist reduction; extracted resistance-capacitance-inductance-mutual inductance netlist; interconnect circuits; model order reduction; mutual inductance; nodal time constants; preprocessing step; realizable reduction; self inductance; timing verification; very large scale integration circuits; Circuit simulation; Coupling circuits; Data mining; Frequency; Inductance; Integrated circuit interconnections; RLC circuits; Runtime; Timing; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2004.840545
  • Filename
    1386382