Title :
Reliability of Microwave Radio Reley Systems
Author_Institution :
Bell Telephone Labs., Holmdel, N. J.
fDate :
12/1/1966 12:00:00 AM
Abstract :
A model is proposed for microwave fading so that the outages of microwave relay systems due to propagation fading can be computed from fading data on individual channels. This is important so that the various system design factors can be evaluated as to reliability without extensive building and testing. Such design factors include fading margins, the number of working and protection channels, the width and allocation of radio channels, the number of radio hops per switching section, and the equipment failure rates. Quantitative data show that this theory checks outage data, at least in a particular case.
Keywords :
Buildings; Eigenvalues and eigenfunctions; Equipment failure; Fading; Microwave devices; Microwave propagation; Protective relaying; Relays; Signal to noise ratio; System testing;
Journal_Title :
Communication Technology, IEEE Transactions on
DOI :
10.1109/TCOM.1966.1089399