• DocumentCode
    1215602
  • Title

    Tracking filter for the mitigation of the ionospheric range bias

  • Author

    Lambert, Hendrick C.

  • Author_Institution
    MIT Lincoln Lab., Lexington
  • Volume
    44
  • Issue
    1
  • fYear
    2008
  • fDate
    1/1/2008 12:00:00 AM
  • Firstpage
    339
  • Lastpage
    348
  • Abstract
    An extended Kalman filter (EKF) to estimate the ionospheric total electron content (TEC) along the radar line-of-sight has been developed. By varying the carrier frequency of consecutive radar pulses, it is shown that the TEC along the line-of-sight becomes observable and can be estimated in real-time to a high degree of accuracy. It is shown that the filtering formulation presented here optimally reduces the randomly varying range bias caused by the irregular electron density structure in the upper atmosphere. The performance of the tracking filter is examined with a Monte Carlo simulation analysis. It is shown that for a radar located in Thule, Greenland and operating at a nominal frequency of 435 MHz (UHF), an improvement of approximately 50% in the range estimation accuracy is achieved with a frequency separation of 18 MHz between two consecutive pulses. If the frequency separation is increased to 60 MHz, the increase in accuracy is 75%. It is also shown that in the absence of frequency separation, the performance of the tracking filter presented here reduces to that of a conventional six-state EKF that does not account for the ionospheric bias.
  • Keywords
    Kalman filters; Monte Carlo methods; ionospheric techniques; radar tracking; tracking filters; Greenland; Monte Carlo simulation analysis; Thule; extended Kalman filter; frequency 435 MHz; ionospheric range bias; radar line-of-sight; total electron content; tracking filter; Atmosphere; Calibration; Electrons; Filters; Frequency estimation; Plasma density; Plasma measurements; Radar tracking; Spaceborne radar; Table lookup;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/TAES.2008.4517008
  • Filename
    4517008