Title :
Proton-induced charge transfer degradation in CCDs for near-room temperature applications
Author :
Hopkins, I.H. ; Hopkinson, G.R. ; Johlander, B.
Author_Institution :
SIRA/UCL Postgrad. Centr, Chislehurst, UK
Abstract :
An optical technique for measuring charge transfer inefficiency (CTI) in CCDs, operated under near-room temperature, high readout rate conditions, is described. It is possible to measure trap emission times and CTI dependence on signal size, background charge and clock waveform shape to high accuracy, both for serial and parallel transfers. It is shown that the presence of background charge (or "fat zero") can substantially improve charge transfer efficiency.<>
Keywords :
charge measurement; charge-coupled devices; proton effects; CCDs; CTI dependence; background charge; charge transfer efficiency; charge transfer inefficiency; clock waveform shape; high readout rate conditions; near-room temperature applications; optical technique; parallel transfers; proton-induced charge transfer degradation; serial and parallel transfers; signal size; trap emission times; Charge coupled devices; Charge measurement; Charge transfer; Current measurement; Degradation; Extraterrestrial measurements; Instruments; Optical sensors; Size measurement; Temperature;
Journal_Title :
Nuclear Science, IEEE Transactions on
