DocumentCode :
1215652
Title :
Behind deep blue [Book Review]
Volume :
40
Issue :
6
fYear :
2003
fDate :
6/1/2003 12:00:00 AM
Firstpage :
40
Lastpage :
40
Keywords :
Adders; Book reviews; Circuit testing; Cities and towns; Engineering profession; History; Integrated circuit yield; Materials science and technology; Semiconductor devices; Transistors;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.2003.1203084
Filename :
1203084
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1215652
