DocumentCode
1215652
Title
Behind deep blue [Book Review]
Volume
40
Issue
6
fYear
2003
fDate
6/1/2003 12:00:00 AM
Firstpage
40
Lastpage
40
Keywords
Adders; Book reviews; Circuit testing; Cities and towns; Engineering profession; History; Integrated circuit yield; Materials science and technology; Semiconductor devices; Transistors;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/MSPEC.2003.1203084
Filename
1203084
Link To Document