• DocumentCode
    1215751
  • Title

    EMI/EMC Measurements and Simulations for Cables and PCBs Enclosed Within Metallic Structures

  • Author

    Khan, Zulfiqar A. ; Bayram, Yakup ; Volakis, John L.

  • Author_Institution
    Johnson Controls, Inc, Holland, MI
  • Volume
    50
  • Issue
    2
  • fYear
    2008
  • fDate
    5/1/2008 12:00:00 AM
  • Firstpage
    441
  • Lastpage
    445
  • Abstract
    This paper presents a series of measurements to study various electromagnetic compatibility (EMC)/electromagnetic interference (EMI) coupling scenarios, frequently encountered in electronic systems. Specifically, field penetration through apertures and coupling of penetrating wires onto the printed circuit boards (PCBs) enclosed by resonant structures are considered. In contrast to other measurements, we focus on multi-cavity enclosures in the presence of cables and PCBs. The purpose of this experimental study is to provide accurate reference data for possible future validation of various computational tools and to test their accuracy and efficiency on realistic platforms. In particular, we validate a recently proposed hybrid scheme based on S-parameters for concurrent EMI/EMC analysis of large structures with enclosed linear/nonlinear circuit devices in active operating mode.
  • Keywords
    electromagnetic compatibility; electromagnetic coupling; electromagnetic interference; printed circuits; telecommunication cables; S-parameters; electromagnetic compatibility; electromagnetic coupling; electromagnetic interference; electronic system; linear circuit device; nonlinear circuit device; printed circuit board; telecommunication cables; Apertures; Cables; Circuit simulation; Coupling circuits; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic coupling; Electromagnetic interference; Electromagnetic measurements; Wires; Electromagnetic compatibility (EMC); S-parameters; electromagnetic interference (EMI); measurements;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2008.921030
  • Filename
    4517024