DocumentCode :
1215772
Title :
Targeted Resonance Control in a TEM Cell
Author :
Walters, Andrew J. ; Leat, Chris
Author_Institution :
Defence Sci. & Technol. Organ., Edinburgh, SA
Volume :
50
Issue :
2
fYear :
2008
fDate :
5/1/2008 12:00:00 AM
Firstpage :
252
Lastpage :
258
Abstract :
We investigate extending the upper frequency limit of an asymmetric ldquoCrawford-style´´ transverse electromagnetic (TEM) cell with targeted resonance control. Focusing on the fundamental TE cavity resonance, an active feedback cancellation system is applied with the aim of reducing the resonant field amplitude without affecting the desired TEM mode. A half loop J-dot current probe is positioned with a vertical polarization on one wall of the TEM cell to measure the wall currents generated from the TE resonance. An identical probe is placed on the facing wall that is connected to the first through a negative feedback chain. The second loop´s purpose is to excite a field that has the appropriate magnitude and phase to attenuate the TE resonance amplitude. Experimental application achieved a 17-dB reduction in the amplitude of the resonance field. The method is also outlined with respect to the TE resonance. This system is planned for full-scale implementation into a hybrid reverberation/TEM whole-aircraft electromagnetic vulnerability testing facility.
Keywords :
TEM cells; cavity resonators; electromagnetic wave polarisation; TEM; active feedback cancellation system; cavity resonance; half loop J-dot current probe; negative feedback chain; resonant field amplitude; targeted resonance control; transverse electromagnetic cell; vertical polarization; Current measurement; Electromagnetic wave polarization; Frequency; Negative feedback; Negative feedback loops; Position measurement; Probes; Resonance; TEM cells; Tellurium; Active cancellation; Nyquist stability; modelling; resonance; test equipment; transverse electromagnetic (TEM) cell;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/TEMC.2008.921050
Filename :
4517026
Link To Document :
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