• DocumentCode
    1215784
  • Title

    5 to 160 keV continuous-wave X-ray spectral energy distribution and energy flux density measurements

  • Author

    Tallon, R.W. ; Koller, D.C. ; Pelzl, R.M. ; Pugh, R.D. ; Bellem, R.D.

  • Author_Institution
    Microelectron. and Photonics Res. Branch, USAF Phillips Lab., Kirtland AFB, NM, USA
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • Firstpage
    2112
  • Lastpage
    2117
  • Abstract
    Techniques developed for measuring the X-ray spectral energy distribution (differential intensity) from a tungsten-target bremsstrahlung X-ray source are reported. Spectra with end-point energies ranging from 20 to 160 keV were recorded. A separate effort to calibrate the dosimetry for the Phillips Laboratory low-energy X-ray facility established a need to know the spectral energy distributions at some point within the facility (previous calibration efforts had relied on spectra obtained from computer simulations). It was discovered that the primary discrepancy between the simulated and measured spectra was in the L- and K-line data. The associated intensity (energy flux density) of the measured distributions was found to be up to 30% higher. Based on the measured distributions, predicted device responses were within 10% of the measured response as compared to about 30% accuracy obtained with simulated distributions.<>
  • Keywords
    X-ray production; X-ray spectroscopy; calibration; dosimetry; 5 to 160 keV; K-line; L-line; LEXR; Phillips Laboratory low-energy X-ray facility; W; calibration; computer simulation; continuous-wave X-rays; device responses; differential intensity measurement; dosimetry; energy flux density measurement; spectral energy distribution measurement; tungsten-target bremsstrahlung X-ray source; Density measurement; Detectors; Distributed computing; Energy measurement; Energy resolution; Laboratories; Microelectronics; Phase measurement; Photonics; Space technology;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.340550
  • Filename
    340550